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Modeling Distance Nonlinearity in ToF Cameras and Correction Based on Integration Time Offsets


Authors

  • Uriarte, C.
  • Scholz-Reiter, B.
  • Ramanandan, S. K.
  • Kraus, D.

Meta information [BibTeX]

  • Year: 2011, Reviewed
  • Martin, C. S. and Kim, S.-W. (Editors)
  • In: Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications
  • Subtitle: 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings
  • Conference: 16th Iberoamerican Congress, CIARP 2011 in Pucón, Chile, (November 15-18, 2011)
  • Series: Lecture Notes in Computer Science, Vol. 7042
  • Publisher: Springer, Berlin Heidelberg
  • Pages: 214-222
  • ISBN: 978-3-642-25084-2, eISBN: 978-3-642-25085-9
  • ISSN: 0302-9743
  • DOI: 10.1007/978-3-642-25085-9_25



Arbeitsgruppe BIBA



Uriarte, C.; Scholz-Reiter, B.; Ramanandan, S. K.; Kraus, D.
Modeling Distance Nonlinearity in ToF Cameras and Correction Based on Integration Time Offsets
In: Martin, C. S.; Kim, S.-W. (eds.): Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications. 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings. Springer, Berlin Heidelberg, 2011, pp. 214-222
(Workgroup: BIBA)
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