Weimer, D.; Thamer, H.; Thoben, K.-D.
GPU architecture for unsupervised surface inspection using multi-scale texture analysis
In: Denkena, B.; Duffie, N.; Vollertsen, F. (eds.): Proceedings of the 2nd International Conference on System-Integrated Intelligence: Challenges for Product and Production Engineering. New Challenges for Product and Production Engineering. Procedia CIRP, Paris, 2014,
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